Microphone High-Temperature Test System Development Based on PID Control

Li Yan Zhao

doi:10.4028/www.scientific.net/AMR.912-914.1294

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 912-914Microphone High-Temperature Test System...

Microphone High-Temperature Test System Development Based on PID Control

Abstract:

With PID as its control center, this system overcomes the uncontrol of temperature, lower efficiency, difficult operation and other drawbacks occurring in precious microphone high-temperature test system. Characterized by excellent adaptability, automatic heating and constant temperature function, and simple operation, the high-temperature test system can meet the special requirements during microphone high temperature operation, evaluate the phase, frequency response, background noise and other product indexes in a high temperature ambient, and possess a very high marketing application value.

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Periodical:

Advanced Materials Research (Volumes 912-914)

Pages:

1294-1298

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.912-914.1294

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Online since:

April 2014

Authors:

Li Yan Zhao

Keywords:

Control System, High-Temperature Test, Microphone, PID Control

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References

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DOI: 10.1063/1.2140489

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