Optical Interferometric Technique for Induced Strain Ferroelectric Loop Study at Low Frequency

Siripong Somwan; Khem Chirapatpimol; Apichart Limpichaipanit; Komsanti Chokethawai; Athipong Ngamjarurojana

doi:10.4028/www.scientific.net/AMR.936.110

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 936Optical Interferometric Technique for Induced...

Optical Interferometric Technique for Induced Strain Ferroelectric Loop Study at Low Frequency

Abstract:

Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phase, which in turn leads to a change in the intensity of the interference pattern formed where the reference and probing beams recombine. In this work the electric field induced-strain was measured as a function of electric field (s-E loop) and polarization (s-P loop) of PbMg_1/3Nb_2/3O₃ (PMN) and 0.7PbMg_1/3Nb_2/3O₃-0.3PbZr_0.52Ti_0.48O₃ (0.7PMN-0.3PZT) ceramics, which showed electrostrictive (quadratic shape curve) and piezoelectric (butterfly shape curve) behavior at various frequency (0.01-1Hz).

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Periodical:

Advanced Materials Research (Volume 936)

Pages:

110-114

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.936.110

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Online since:

June 2014

Authors:

Siripong Somwan, Khem Chirapatpimol, Apichart Limpichaipanit, Komsanti Chokethawai, Athipong Ngamjarurojana*

Keywords:

Electrostrictive, Ferroelectric, Optical Interferometry, Piezoelectric

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