A New Measurement System of Yarn Appearance Based on Machine Vision

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Abstract:

In this paper, a new yarn appearance measurement system based on machine vision is introduced. The yarn images are continuously captured by image acquisition system. To extract the main body of the yarn accurately, the yarn images are processed sequentially with threshold segmentation and morphological opening operation. Then the coefficient of variation (CV value) of diameter is calculated to characterize the yarn evenness. The measurement process achieves result (CV value) which can be compared with USTER evenness tester by image processing techniques. By comparing different methods which use different algorithms, a suitable method is chosen to be used in this new measurement system. Then a more accurate, more efficient and faster measurement system will meet requirements in the future.

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Periodical:

Advanced Materials Research (Volumes 945-949)

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1810-1814

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June 2014

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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[1] H. Asgari, F. Mokhtari, M. Latifi and M. Amani-Tehran: Journal of The Textile Institute Vol. 10 (2013), P. 1-6.

Google Scholar

[2] S. Fattahi, Sa. H. Ravandi and S.M. Taheri: Journal of The Textile Institute Vol. 102 (2011), P. 849-856.

Google Scholar

[3] M. Jir, I. Sayed and K. Gabriela: Journal of Donghua University Vol. 23 (2006), P. 154-160.

Google Scholar

[4] Y. A. Ozkaya, M. Acar and M.R. Jackson: Journal of The Textile Institute Vol. 98 (2007), P. 483-490.

Google Scholar

[5] S. Mukhopadhyay and B. Chanda: Pattern Recognition Vol. 34 (2001), P. 1939-(1949).

Google Scholar

[6] Yumei Wang and Guosheng Xu: The Ninth International Conference on Electronic Measurement & Instruments Vol. 4 (2009), P. 500-503.

Google Scholar

[7] Shaowei Shen, Shuhua Yan, Chunlei Zhou and Huipeng Tong: The Eighth International Conference on Electronic Measurement and Instruments Vol. 2 (2007), P. 969-973.

DOI: 10.1109/icinfa.2008.4608298

Google Scholar

[8] A. Sparavigna, E. Broglia, E. Lugli: Mechatronics Vol. 14 (2004), P. 1183-1196.

Google Scholar

[9] Qindian Zhao: Textile science and technology progress Vol. 6 (2009), P. 42-43.

Google Scholar

[10] M. Tapias, M. Rallo, J. Escofet, I. Algaba and A. Riva: Textile Res Vol. 80 (2010), P. 35-44.

Google Scholar