Design and Calibration of a Cutting Force Dynamometer

Zong Jin Ren; Jun Zhang; Zhen Yuan Jia; Yong Yan Shang

doi:10.4028/www.scientific.net/AMR.945-949.2191

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 945-949Design and Calibration of a Cutting Force...

Design and Calibration of a Cutting Force Dynamometer

Abstract:

In modern industry the processing quality and precision become the concerned aspects. The cutting force dynamometer could ensure the two points by adjusting the cutting parameters. A piezoelectric dynamometer is introduced. The electric potential of X0 and Y0 crystal wafer has been analyzed by ANSYS under F_z, F_x and M_z. For the F_x and M_z measurement, the charge distribution expression is calculated by nonlinear elasticity and piezoelectric theory. The dynamometer is designed and the calibration experiments have been had. The nonlinearity and repeatability of M_z, F_x, and F_z are 0.77% and 1.05%, 0.46% and 0.58%, 0.34% and 0.69.

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Periodical:

Advanced Materials Research (Volumes 945-949)

Pages:

2191-2194

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.945-949.2191

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Online since:

June 2014

Authors:

Zong Jin Ren, Jun Zhang, Zhen Yuan Jia*, Yong Yan Shang

Keywords:

Calibration, Crystal Wafer, Dynamometer, Piezoelectricity

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* - Corresponding Author

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