Research on Solidification Characteristics of Resin in High-Resolution Stereolithography System

Abstract:

To control the building resolution and accuracy of high-resolution Stereolithography (SL) system, a novel building parameter which is the ratio of laser power to laser beam scanning speed has been proposed. Researches were performed to investigate the relationship of cured line width and depth with the ratio of laser power to laser beam scanning speed of the SL system. The experimental results show that cured depth and width increase with the ratio of laser power to scanning speed. Based on the cured line width and depth obtained in the experiment, empirical equations predicting cured line width and depth according to the ratio of laser power to scanning speed in the SL system have been established by using least squares method, the empirical equations provide the foundation for improving building resolution and accuracy of high-resolution SL system with linewidth accurately compensation and layer thickness appropriately setup in the high-resolution SL system.

• Periodical: Advanced Materials Research (Volumes 97-101)
• Pages: 3989-3992
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.97-101.3989
• Online since: March 2010
• Authors: Guang Shen Xu, Xun Ming Ma, Sheng Luo, Rong Hua Qiu
• Keywords: Cured Line Depth, Cured Line Width, Least-Square Method (LSM), Rapid Prototyping (RP), Stereolithography

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