On a Method of Getting Test Data for Boundary Scan Interconnection Test in Multiple Scan Chains

Abstract:

The goal of this paper is to present a new innovative method of getting test data for boundary scan interconnection test in multiple scan chains, so to decrease the test time and increase the efficiency and reliability. Firstly, a new model of configuring and optimizing multiple scan chains is formed based on the researches on greedy strategy for configuring multiple scan chains for internal test and the sorting algorithm of single scan chain for Cluster test. Then, a method of establishing test project description file (TPDF) is presented in order to get the test data quickly and effectively. During the testing of two different boundary-scan circuit boards, all faults can be detected. Experiment results show that the expected objective is achieved.

• Periodical: Advanced Materials Research (Volumes 986-987)
• Pages: 1531-1535
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.986-987.1531
• Online since: July 2014
• Authors: Xian Hua Yin*, Cui Feng Xu
• Keywords: Boundary Scan, Interconnect Test, Multiple Scan Chains, TPDF

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