Study on a New Test and Diagnosis Method for Complex Integrated Circuit

Xiu Fang Wang; Jin Ye Peng; Bin Chen

doi:10.4028/www.scientific.net/AMR.986-987.1591

Paper Titles

Research on the Measurement of Household Appliance Impedance Characteristic
p.1574

Research on the Optimization Model of Fault Detection for Large-Scale Electronic Circuit
p.1579

Research on the Winding Deformation Testing System for Transformers Based on the FRA
p.1583

Simulation on Fault Detection Optimization Model of Large Intelligent Electronic Inverter
p.1587

Study on a New Test and Diagnosis Method for Complex Integrated Circuit
p.1591

Synchronization Optimization Simulation of Optical Fiber Network Fault Features and Model Parameters
p.1596

The Analysis of Device Model in CMOS Integrated Temperature Sensor
p.1600

The Design and Analysis of Substation Equipment Temperature Wireless Monitoring System
p.1606

The Irremovable Properties Proof of Decaying DC Component for Dynamic Phasor Measurement
p.1611

HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 986-987Study on a New Test and Diagnosis Method for...

Study on a New Test and Diagnosis Method for Complex Integrated Circuit

Abstract:

Due to the problem that test signals is difficult to describe and analyze in the microprocessor (CPU) and digital signal processor (DSP) circuit, this paper come up with a matrix base method to describe program signal and instruction signal, thus in theory solve the above problem. In the proposed method, simple hardware circuits can be used to produce different test signal needed in the test and diagnose of CPU circuit.