Spatial Convolution of a Stress Field Analyzed by X-Ray Diffraction

Charlie Kahloun; R. Badji; S. Queyreau; P. Franciosi; Brigitte Bacroix

doi:10.4028/www.scientific.net/AMR.996.169

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 996Spatial Convolution of a Stress Field Analyzed by...

Spatial Convolution of a Stress Field Analyzed by X-Ray Diffraction

Abstract:

X-ray stress analysis suffers from homogeneity limitations of the stress field in the analyzed volume. When this homogeneity is not fulfilled, it is possible to reduce the irradiated volume down to stress homogeneity achievement. New limitation however occurs : the diffracting sites become too few for stress homogenization. We show that the diffractometry analysis corresponds to a spatially convoluted stress field. The inverse convolution problem is posed. An example of regularization method is given.

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Periodical:

Advanced Materials Research (Volume 996)

Pages:

169-174

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.996.169

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Online since:

August 2014

Authors:

Charlie Kahloun*, R. Badji, S. Queyreau, P. Franciosi, Brigitte Bacroix

Keywords:

Inverse Problem, Spatial Convolution, Stress Gradient, XRD Stress Measurement

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