Paper Titles

Microscopic Stress and Strain Evolved in a Twinning-Induced Plasticity Fe-Mn-C Steel
p.135

Effects of Misalignment of Parallel Beam Optics on Thin Film Stress Analysis
p.141

New Developments of Multireflection Grazing Incidence Diffraction
p.147

Determination of Stress Profiles in Expanded Austenite by Combining Successive Layer Removal and GI-XRD
p.155

Stress Gradient Analysis by Noncomplanar x-Ray Diffraction and Corresponding Refraction Correction
p.162

Spatial Convolution of a Stress Field Analyzed by X-Ray Diffraction
p.169

Influence of Layer Removal Methods in Residual Stress Profiling of a Shot Peened Steel Using X-Ray Diffraction
p.175

Material Removal, Correction and Laboratory X-Ray Diffraction
p.181

Looking Towards the Future of Strain Scanning Using Neutron Diffraction
p.187

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 996Stress Gradient Analysis by Noncomplanar x-Ray...

Stress Gradient Analysis by Noncomplanar x-Ray Diffraction and Corresponding Refraction Correction

Article Preview

Abstract:

X-ray residual stress analysis is a widespread nondestructive technique to investigate the residual stress and residual stress gradient in thin films and protective coatings.In the present contribution we introduce a new method based on the noncomplanar measurement geometry that allow to span large area of sin² ψ and penetration depth values without sample inclination. The refraction correction and absorption is considered in details for the noncomplanar measurements. The proposed technique is applied to determine stress gradients of blasted hard TiN coatings.

By email View Pdf

You have full access to the following eBook

Residual Stresses IX

Info:

Periodical:

Advanced Materials Research (Volume 996)

Pages:

162-168

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.996.162

Citation:

Cite this paper

Online since:

August 2014

Authors:

Andrei Benediktovitch*, Tatjana Ulyanenkova, Jozef Keckes, Alex Ulyanenkov

Keywords:

Absorption, DWBA, Noncomplanar Diffraction Geometry, Refraction, Residual Stress Depth Profiles

Export:

RIS, BibTeX

Permissions:

Creative Commons CC BY 4.0

Share:

Citation:

* - Corresponding Author

[1] U. Welzel, J. Ligot, P. Lamparter, A. C. Vermeulen and E. J. Mittemeijer. J. Appl. Cryst. 2005. Vol. 38, pp.1-29.

[2] H. Ruppersberg, I. Detemple, J. Krier. Physica Status Solidi (a). 1989. Vol. 116(2), 681687.

[3] H. Behnken and V. Hauk. Materials Science and Engineering: A. 2001. Vol. 300(1-2). pp.41-51.

[4] C. Genzel. Physica Status Solidi (a). 1994. Vol. 146(2). p.629637.

[5] Ch. Genzel, I. A. Denks, M. Klaus, in Modern Diffraction Methods, Wiley-VCH, Weinheim. 2012, pp.127-154.

DOI: 10.1002/9783527649884.ch5

[6] M. Stefenelli, J. Todt, A. Riedl, W. Ecker, T. Muller, R. Daniel, M. Burghammer, J. Keckes. J. Appl. Cryst. 2013. Vol. 46(5), pp.1378-1385.

DOI: 10.1107/s0021889813019535

[7] A. Kumar, U. Welzel and E. J. Mittemeijer. J. Appl. Cryst. 2006. Vol. 39, pp.633-64638.

[8] Th. Erbacher, A. Wanner, T. Beck and O. Vhhringer. J. Appl. Cryst. 2008. Vol. 41, pp.377-385.

[9] M. Bartosik, R. Pitonak and J. Keckes. Adv. Eng. Mat. 2011. Vol. 13, N 8, 705-711.

[10] K. Nagao, E. Kagami. Rigaku Journal. 2011. Vol. 27(2), 6-14.

[11] A. Benediktovitch, T. Ulyanenkova, J. Keckes, A. Ulyanenkov. JAC, sent.

[12] M. Hart, W. Parrish, M. Bellotto, G.S. Lim. Acta Cryst. 1988. Vol. A44, 193-197.

[13] M. F. Toney, S. Brennan. Phys. Rev. B. 1989. Vol. 39, 7963-7966.

[14] S. Wro´nski, K. Wierzbanowski, A. Baczma´nski, A. Lodini, Ch. Braham, W. Seiler. Powder Diffraction Suppl. 24 (S1) 2009 S11-S15.

DOI: 10.1154/1.3139054

[15] A. Benediktovitch, I. Feranchuk, A. Ulyanenkov, Theoretical Concepts of X-ray Nanoscale Analysis. Theory and Applications. Springer. 2014. 318p.

DOI: 10.1007/978-3-642-38177-5_3

[16] A. Benediktovitch, H. Guerault, I. Feranchuk, V. Uglov, A. Ulyanenkov. Material Sci. Forum. 2011, 681, 121-126.

DOI: 10.4028/www.scientific.net/msf.681.121