Effects of Misalignment of Parallel Beam Optics on Thin Film Stress Analysis

Nicholas Norberg; Arnold C. Vermeulen

doi:10.4028/www.scientific.net/AMR.996.141

Paper Titles

Study of Mechanical Behaviour of Polycrystalline Materials at the Mesoscale Using High Energy X-Ray Diffraction
p.118

Distribution of Residual Deformation Effects in Shell Tubes from Ferritic-Martensitic Steels
p.124

Residual Stress Tensor Distributions in Cracked Austenitic Stainless Steel Measured by Two-Dimensional X-Ray Diffraction Method
p.128

Microscopic Stress and Strain Evolved in a Twinning-Induced Plasticity Fe-Mn-C Steel
p.135

Effects of Misalignment of Parallel Beam Optics on Thin Film Stress Analysis
p.141

New Developments of Multireflection Grazing Incidence Diffraction
p.147

Determination of Stress Profiles in Expanded Austenite by Combining Successive Layer Removal and GI-XRD
p.155

Stress Gradient Analysis by Noncomplanar x-Ray Diffraction and Corresponding Refraction Correction
p.162

Spatial Convolution of a Stress Field Analyzed by X-Ray Diffraction
p.169

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 996Effects of Misalignment of Parallel Beam Optics on...

Effects of Misalignment of Parallel Beam Optics on Thin Film Stress Analysis

Abstract:

Collecting reliable data is crucial in the research of residual stresses in thin films using X-ray diffraction. The parallel beam geometry has advantage of reliability compared to focusing beam geometry. Though care must be taken to the alignment. A small alignment error may cause a significant error in the stress value. We will show the sensitivity for the misalignment of the parallel beam optics, discuss requirements on hardware alignment and demonstrate a software correction for the presence of remaining hardware errors.

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Periodical:

Advanced Materials Research (Volume 996)

Pages:

141-146

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.996.141

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Online since:

August 2014

Authors:

Nicholas Norberg, Arnold C. Vermeulen*

Keywords:

Alignment Error, Grazing Incidence, Parallel Beam Geometry, Residual Stress, Thin Film Stress, X-Ray Diffraction (XRD)

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Creative Commons CC BY 4.0

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* - Corresponding Author

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