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Application of X-Ray Microtomography to the Microstructural Characterization of Al-Based Functionally Graded Materials

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Abstract:

This paper provides a brief overview of the possibilities offered by X-ray computed microtomography, and particularly synchrotron radiation X-ray microtomography, regarding metal matrix composite characterization, emphasis being placed in the case of Al-based functionally graded materials. Examples are provided concerning the characterization of the reinforcement population, interfacial properties, in-situ transformation and damage evolution. The specific needs of the technique and limitations to its widespread use are mentioned.

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Periodical:

Advances in Science and Technology (Volume 45)

Pages:

1109-1116

DOI:

https://doi.org/10.4028/www.scientific.net/AST.45.1109

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Online since:

October 2006

Authors:

Alexandre Velhinho, Francisco Manuel Braz Fernandes, S.C. Ferreira, L.A. Rocha, Gerard Vignoles, P. Cloetens

Keywords:

Computed Tomography, Damage, Data Processing, Functionally Graded Material (FGM), Image Analysis, Interface, Metal Matrix Composite (MMC), Microstructure, Microtomography

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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