Application of X-Ray Microtomography to the Microstructural Characterization of Al-Based Functionally Graded Materials

Abstract:

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This paper provides a brief overview of the possibilities offered by X-ray computed microtomography, and particularly synchrotron radiation X-ray microtomography, regarding metal matrix composite characterization, emphasis being placed in the case of Al-based functionally graded materials. Examples are provided concerning the characterization of the reinforcement population, interfacial properties, in-situ transformation and damage evolution. The specific needs of the technique and limitations to its widespread use are mentioned.

Info:

Periodical:

Edited by:

P. VINCENZINI

Pages:

1109-1116

DOI:

10.4028/www.scientific.net/AST.45.1109

Citation:

A. Velhinho et al., "Application of X-Ray Microtomography to the Microstructural Characterization of Al-Based Functionally Graded Materials", Advances in Science and Technology, Vol. 45, pp. 1109-1116, 2006

Online since:

October 2006

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$35.00

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