Electro-Stimulated Piezo-Spectroscopy for Measuring Nano-Scale Residual Stress Fields in Ceramics

Abstract:

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Electro-stimulated piezo-spectroscopy (PS) can be quantitatively used for obtaining information about applied and residual stress fields piled up in ceramic materials and devices. PS experiments can be conducted in a field-emission-gun scanning electron microscope (FEG-SEM) equipped with a high spectral resolution cathodoluminescence (CL) spectrometer. Micromechanical information can be thus added to the microscopic crystallographic and chemical information already available in conventional SEM devices. Independent of the physical mechanisms behind CL emission, the spectral position of selected bands in ceramics is shown to possess high stress sensitivity. In addition, given the high scanning flexibility and spatial resolution of the electron beam, residual stress assessments can be performed on relatively large areas with significantly improved spatial resolution as compared with the more popular photo-stimulated PS approach (i.e., using a laser beam as the excitation source). In this paper, we first quantitatively characterize the stress dependence of the spectroscopic bands observed in ruby. Then, based on this knowledge, an application is shown of bi-dimensional residual stress mapping around an indentation print.

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Periodical:

Edited by:

P. VINCENZINI

Pages:

1658-1663

DOI:

10.4028/www.scientific.net/AST.45.1658

Citation:

G. Pezzotti et al., "Electro-Stimulated Piezo-Spectroscopy for Measuring Nano-Scale Residual Stress Fields in Ceramics ", Advances in Science and Technology, Vol. 45, pp. 1658-1663, 2006

Online since:

October 2006

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$35.00

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