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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 103-105Method and Model for Treating Negative-U Centers...

Method and Model for Treating Negative-U Centers in Silicon: Si:V^o and Si:(VH₃)^-

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Defects in Semiconductors I

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Periodical:

Defect and Diffusion Forum (Volumes 103-105)

Pages:

349-366

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.103-105.349

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Online since:

January 1993

Authors:

S.S. Moliver

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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