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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 103-105Two-Level Correlated Model for Recombination in...

Two-Level Correlated Model for Recombination in y,e-Irradiated Silicon

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Defects in Semiconductors I

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Periodical:

Defect and Diffusion Forum (Volumes 103-105)

Pages:

587-594

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.103-105.587

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Online since:

January 1993

Authors:

S.M. Dickmann

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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