Electromigration-Induced Dislocation Climb and Multiplication in Conducting Lines
a.467
a.467
Electromigration Failure in a Finite Conductor with a Single Blocking Boundary
a.468
a.468
An Analytical Model for the Grain Structures of Near-Bamboo Interconnects
a.469
a.469
Point Defects, On the Copious Formation of Vacancies in Metals, due to Hydrogen Dissolution
a.470
a.470
From E' Centers to the Characteristic Resonance
a.471
a.471
Alignment of Point Defects by Slip Deformation
a.472
a.472
Optical Absorption Spectroscopy of Defects in Halides
a.473
a.473
Inverted Level Ordering for a Double Acceptor or Acceptor-Bound Exciton
a.474
a.474
Properties of Frenkel Defects
a.475
a.475
From E' Centers to the Characteristic Resonance
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