Diffusion-Induced Stresses in an Electric Field
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a.463
A Modified Electrostatic Model for the Diffusion of Electropositive Impurities in Noble Metals - I
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a.464
A Modified Electrostatic Model for the Diffusion of Electropositive Impurities in Noble Metals - II
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a.465
Electromigration, On the Theory of Electromigration Failure in Polycrystalline Metal Films
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a.466
Electromigration-Induced Dislocation Climb and Multiplication in Conducting Lines
a.467
a.467
Electromigration Failure in a Finite Conductor with a Single Blocking Boundary
a.468
a.468
An Analytical Model for the Grain Structures of Near-Bamboo Interconnects
a.469
a.469
Point Defects, On the Copious Formation of Vacancies in Metals, due to Hydrogen Dissolution
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a.470
From E' Centers to the Characteristic Resonance
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a.471
Electromigration-Induced Dislocation Climb and Multiplication in Conducting Lines
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