Thermodynamics of Atom-Vacancy Solid Solutions, as Deduced from a Self-Diffusion Arrhenius Plot
a.461
a.461
Muonium Dynamics in Semiconductors
a.462
a.462
Diffusion-Induced Stresses in an Electric Field
a.463
a.463
A Modified Electrostatic Model for the Diffusion of Electropositive Impurities in Noble Metals - I
a.464
a.464
A Modified Electrostatic Model for the Diffusion of Electropositive Impurities in Noble Metals - II
a.465
a.465
Electromigration, On the Theory of Electromigration Failure in Polycrystalline Metal Films
a.466
a.466
Electromigration-Induced Dislocation Climb and Multiplication in Conducting Lines
a.467
a.467
Electromigration Failure in a Finite Conductor with a Single Blocking Boundary
a.468
a.468
An Analytical Model for the Grain Structures of Near-Bamboo Interconnects
a.469
a.469
A Modified Electrostatic Model for the Diffusion of Electropositive Impurities in Noble Metals - II
Page: A465