A Modified Electrostatic Model for the Diffusion of Electropositive Impurities in Noble Metals - II
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a.465
Electromigration, On the Theory of Electromigration Failure in Polycrystalline Metal Films
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a.466
Electromigration-Induced Dislocation Climb and Multiplication in Conducting Lines
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a.467
Electromigration Failure in a Finite Conductor with a Single Blocking Boundary
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a.468
An Analytical Model for the Grain Structures of Near-Bamboo Interconnects
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a.469
Point Defects, On the Copious Formation of Vacancies in Metals, due to Hydrogen Dissolution
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a.470
From E' Centers to the Characteristic Resonance
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Alignment of Point Defects by Slip Deformation
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a.472
Optical Absorption Spectroscopy of Defects in Halides
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a.473
An Analytical Model for the Grain Structures of Near-Bamboo Interconnects
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