Abstracts

Modelling of ¹⁸O Tracer Diffusion during “Double Oxidation” Experiments
a.471

Violation of the Gradient Approximation in Nuclear Magnetic Resonance Self-Diffusion Measurements
a.472

Electromigration, Minimum Failure Time in Electromigration
a.473

Fast Domain Growth via Density-Dependent Diffusion in a Driven Lattice Gas
a.474

Electromigration-Induced Stress Evolution in Confined Metal Lines
a.475

Cluster Interactions and Stress Evolution during Electromigration in Confined Metal Interconnects
a.476

Interface Instability in an Electric Field
a.477

Point Defects, Classification of Grown-In Microdefects
a.478

Topology of the Phason Degree of Freedom, Phason Singularities and Diffusive Motion in Octagonal Quasicrystals
a.479

HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 123-124Electromigration-Induced Stress Evolution in...

Electromigration-Induced Stress Evolution in Confined Metal Lines

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