Violation of the Gradient Approximation in Nuclear Magnetic Resonance Self-Diffusion Measurements
a.472
a.472
Electromigration, Minimum Failure Time in Electromigration
a.473
a.473
Fast Domain Growth via Density-Dependent Diffusion in a Driven Lattice Gas
a.474
a.474
Electromigration-Induced Stress Evolution in Confined Metal Lines
a.475
a.475
Cluster Interactions and Stress Evolution during Electromigration in Confined Metal Interconnects
a.476
a.476
Interface Instability in an Electric Field
a.477
a.477
Point Defects, Classification of Grown-In Microdefects
a.478
a.478
Topology of the Phason Degree of Freedom, Phason Singularities and Diffusive Motion in Octagonal Quasicrystals
a.479
a.479
Theory of Electron 2-Band Self-Trapping in Atomic Soft Configurations
a.480
a.480
Cluster Interactions and Stress Evolution during Electromigration in Confined Metal Interconnects
Page: A476