Electromigration-Induced Stress Evolution in Confined Metal Lines
a.475
a.475
Cluster Interactions and Stress Evolution during Electromigration in Confined Metal Interconnects
a.476
a.476
Interface Instability in an Electric Field
a.477
a.477
Point Defects, Classification of Grown-In Microdefects
a.478
a.478
Topology of the Phason Degree of Freedom, Phason Singularities and Diffusive Motion in Octagonal Quasicrystals
a.479
a.479
Theory of Electron 2-Band Self-Trapping in Atomic Soft Configurations
a.480
a.480
Scattering and Trapping of Positrons at Vacancies in Solids
a.481
a.481
Effects of Defects upon the Friction between Film and Substrate in a Microbalance
a.482
a.482
High-Temperature Internal Friction in Crystalline and Amorphous Solids
a.483
a.483
Topology of the Phason Degree of Freedom, Phason Singularities and Diffusive Motion in Octagonal Quasicrystals
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