Abstracts

Cu: Twins
a.225

Cu-(0.05 to 5at%)Al: Dislocations and Grain Boundaries
a.226

Cu-Al-Ni: Twins
a.227

Cu₃Au, Ni₃Al, NiAl: Point Defects
a.228

Fe: Electromigration
a.229

Fe-Al: Dislocations
a.230

Fe-35mol%Al: Antiphase Boundaries, Point Defects, and Stacking Faults
a.231

Fe-C, Fe-N: Electromigration
a.232

Fe-(9, 18, or 50)%Cr: Electron Irradiation and Dislocations
a.233

HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 131-132Fe: Electromigration

Fe: Electromigration

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