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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 134-135Analysis of Defects in Metals, Semiconductors and...

Analysis of Defects in Metals, Semiconductors and Photoconducting Insulators through Current Noise Measurements

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Defect and Diffusion Forum Vols. 134-135

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Periodical:

Defect and Diffusion Forum (Volumes 134-135)

Pages:

25-32

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.134-135.25

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Online since:

March 1996

Authors:

Anna Carbone, P. Mazzetti

Keywords:

Current Noise Spectroscopy, Deep Defect Levels, Semiconductor, Shallow Defect Levels

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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