Analysis of Defects in Metals, Semiconductors and Photoconducting Insulators through Current Noise Measurements

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Periodical:

Defect and Diffusion Forum (Volumes 134-135)

Edited by:

David J. Fisher

Pages:

25-32

DOI:

10.4028/www.scientific.net/DDF.134-135.25

Citation:

A. Carbone and P. Mazzetti, "Analysis of Defects in Metals, Semiconductors and Photoconducting Insulators through Current Noise Measurements", Defect and Diffusion Forum, Vols. 134-135, pp. 25-32, 1996

Online since:

March 1996

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$35.00

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