Physical Properties of Boron-Nitride and Carbon-Nitride Films Deposited by Sputtering
p.3
p.3
New Applications of Porous Silicon
p.15
p.15
Analysis of Defects in Metals, Semiconductors and Photoconducting Insulators through Current Noise Measurements
p.25
p.25
Raman Spectroscopy on Amorphous Silicon Based Alloys
p.33
p.33
Modelling of Superalinearity and Thermal Quenching of Photoconductivity in Amorphous Silicon
p.39
p.39
Diffusion in Metallic Glasses under Non-Equilibrium Conditions
p.47
p.47
Electronic Structure and Energy of the Defect-Impurity Complexes in Intermetallic Compund TiAl
p.73
p.73
Defect Structures in Spinel Ferrites
p.89
p.89
Raman Spectroscopy on Amorphous Silicon Based Alloys
Abstract:
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Periodical:
Defect and Diffusion Forum (Volumes 134-135)
Pages:
33-38
Citation:
Online since:
March 1996
Authors:
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Сopyright:
© 1996 Trans Tech Publications Ltd. All Rights Reserved
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