Abstracts

Dynamic Transitions in Correlated Driven Diffusion in a Periodic Potential
a.439

Discrete-Time Methods for the Transport of Foreign Atoms in Semiconductors
a.440

Electromigration, Effect of Grain-Boundary Diffusion Anisotropy upon Via Electromigration Failure
a.441

Effects of Grain Structure and Grain Growth upon Electromigration
a.442

Physical Metallurgy of Electromigration
a.443

Point Defects, Cell Model for Interstitials in Binary Substitutional Solutions
a.444

Theory of Huang X-Ray Scattering Caused by Point Defects
a.445

Tight-Binding Molecular Dynamics Simulations of Semiconductor Alloys
a.446

Elastic Force on a Point Defect in or Near to a Surface Layer
a.447

HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 150-151Physical Metallurgy of Electromigration

Physical Metallurgy of Electromigration

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