Abstracts

Surface Step-Dislocation Transition and Nucleation at a Solid Free Surface
a.502

Planar Defects, Monte Carlo Simulation of the Electron Beam-Induced Current Grain-Boundary Contrast in Semiconductors
a.503

Tilt Boundary as a Set of Randomly Distributed Dislocations
a.504

Imaging of Grain Boundaries via Field Emission Auger Microprobes
a.505

Theory of Semiconductor Surface Reconstruction
a.506

Driving Force for Grain Boundary Migration during Electromigration
a.507

Diffuse-Interface Description of Grain Boundary Motion
a.508

Effects of Stacking Faults on De-Channelling
a.509

Ionic Conduction, Point Contacts in Solid-State Ionics
a.510

HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 150-151Theory of Semiconductor Surface Reconstruction

Theory of Semiconductor Surface Reconstruction

Page: A506