Planar Defects, Monte Carlo Simulation of the Electron Beam-Induced Current Grain-Boundary Contrast in Semiconductors
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Tilt Boundary as a Set of Randomly Distributed Dislocations
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Imaging of Grain Boundaries via Field Emission Auger Microprobes
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Theory of Semiconductor Surface Reconstruction
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a.506
Driving Force for Grain Boundary Migration during Electromigration
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a.507
Diffuse-Interface Description of Grain Boundary Motion
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Effects of Stacking Faults on De-Channelling
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Ionic Conduction, Point Contacts in Solid-State Ionics
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Ionic Conduction in Glass Ceramics
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Driving Force for Grain Boundary Migration during Electromigration
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