Imaging of Grain Boundaries via Field Emission Auger Microprobes
a.505
a.505
Theory of Semiconductor Surface Reconstruction
a.506
a.506
Driving Force for Grain Boundary Migration during Electromigration
a.507
a.507
Diffuse-Interface Description of Grain Boundary Motion
a.508
a.508
Effects of Stacking Faults on De-Channelling
a.509
a.509
Ionic Conduction, Point Contacts in Solid-State Ionics
a.510
a.510
Ionic Conduction in Glass Ceramics
a.511
a.511
Chemical Trends in the Real Space Pseudopotential of Zincblende-Structured Binary Compounds
a.512
a.512
Unified Site Relaxation Model for Ion Mobility in Glassy Materials
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a.513
Effects of Stacking Faults on De-Channelling
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