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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 162-163

Defect and Diffusion Forum Vols. 162-163

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.162-163

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Table of Contents

Paper Title Page

Defect Distribution on Epilayer/Sustrate Interfaces of ISOVPE-MCT Films

Authors: U. Gilabert, A.B. Trigubó, R. González, N.E. Walsöe de Reca

1

Defects in Implanted Hg_1-xCd_xTe: Electrical and Structural Characterization

Authors: M.H. Aguirre, H. Cánepa, E. Heredia, N.E. Walsöe de Reca

21

Dislocations in GaAs: Their Impact on Electronic and Atomic Processes

Authors: T. Wosiński, T. Figielski

27

Electronic Structures of Dangling-Bond Structures Fabricated on Hydrogen-Terminated Si(100)-2 x 1 Surfaces

Authors: T. Hitosugi, T. Hashizume, S. Heike, H. Kajiyama, Y. Wada, S. Watanabe, T. Hasegawa, Koichi Kitazawa

43

Recent Progress in the Understanding of Surface Diffusion: Influence of Phase Transitions and Surface Heterogeneities

Authors: F. Nieto, Alexander Tarasenko, C. Uebing

59

Some Non-Fickian Diffusion Equations: Theory and Applications

Authors: Amal K. Das

97

Comment on 'Dopant Migration Caused by Point Defect Gradients' [P.Pichler, S. List: Solid State Phenomena, 32-33 (1993) 259]

Authors: K. Maser

119