ZnSe/GaAs: Stacking Faults
a.447
a.447
ZnTe: Dislocations
a.448
a.448
ZnTe/GaAs: Dislocations and Stacking Faults
a.449
a.449
Evidence of Harrison's Type-A and B Diffusion Regimes in II-VI Semiconductors
a.450
a.450
Coupled Diffusion of Impurity Atoms and Point Defects in the Vicinity of Semiconductor Interfaces and Grain Boundaries
a.451
a.451
Surface Diffusion Mechanism for Step Bunching
a.452
a.452
Space Charge Effects upon Dopant Diffusion Measurements in Semiconductors
a.453
a.453
Induced Electric-Field Effect upon Heavily-Compensated p-Type Semiconductors
a.454
a.454
Defect Production in Collision Cascades in Elemental Semiconductors and Face-Centered Cubic Metals
a.455
a.455
Coupled Diffusion of Impurity Atoms and Point Defects in the Vicinity of Semiconductor Interfaces and Grain Boundaries
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