Coupled Diffusion of Impurity Atoms and Point Defects in the Vicinity of Semiconductor Interfaces and Grain Boundaries
a.451
a.451
Surface Diffusion Mechanism for Step Bunching
a.452
a.452
Space Charge Effects upon Dopant Diffusion Measurements in Semiconductors
a.453
a.453
Induced Electric-Field Effect upon Heavily-Compensated p-Type Semiconductors
a.454
a.454
Defect Production in Collision Cascades in Elemental Semiconductors and Face-Centered Cubic Metals
a.455
a.455
Deformation Patterns in Thin Films under Uniform Laser Irradiation
a.456
a.456
Channelling and Diffusion in Dry-Etch Damage
a.457
a.457
Rose Deformation Patterns in Thin Films Irradiated with Focussed Laser Beams
a.458
a.458
Computer Simulation of Threading Dislocation Density Reduction in Heteroepitaxial Layers
a.459
a.459
Defect Production in Collision Cascades in Elemental Semiconductors and Face-Centered Cubic Metals
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