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Abstracts
Defect Production in Collision Cascades in Elemental Semiconductors and Face-Centered Cubic Metals
a.455
Deformation Patterns in Thin Films under Uniform Laser Irradiation
a.456
Channelling and Diffusion in Dry-Etch Damage
a.457
Rose Deformation Patterns in Thin Films Irradiated with Focussed Laser Beams
a.458
Computer Simulation of Threading Dislocation Density Reduction in Heteroepitaxial Layers
a.459
Deformation Interaction of Defects in Crystals
a.460
Dislocation Patterns in Strained Layers from Sources on Parallel Glide Planes
a.461
On a Reciprocal Relationship between the Deformation Fields of a Line Force and a Straight Dislocation
a.462
Critical Thickness and Strain Relaxation in Lattice-Mismatched II-VI Semiconductor Layers
a.463
HomeDefect and Diffusion ForumDefects and Diffusion in Semiconductors ICritical Thickness and Strain Relaxation in...

Critical Thickness and Strain Relaxation in Lattice-Mismatched II-VI Semiconductor Layers

Page: A463

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