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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 173-174TEM Study of Dislocations in ZnTe/GaAs...

TEM Study of Dislocations in ZnTe/GaAs Heterostructure Grown by Hot-Wall Epitaxy

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Defects and Diffusion in II-VI Compounds

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Periodical:

Defect and Diffusion Forum (Volumes 173-174)

Pages:

59-66

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.173-174.59

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Online since:

August 1999

Authors:

Peide Han

Keywords:

High Resolution Electron Microscopy (HREM), Large-Angle Stereo-Projection, Misfit Dislocation, Stacking Fault, TEM

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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