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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 194-199Tracer Self- Diffusion Studies in Amorphous...

Tracer Self- Diffusion Studies in Amorphous Si-(B)-C-N Ceramics Using Ion Implantation and SIMS

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Diffusion in Materials DIMAT2000

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Periodical:

Defect and Diffusion Forum (Volumes 194-199)

Pages:

941-946

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.194-199.941

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Online since:

April 2001

Authors:

Harald Schmidt, Günter Borchardt, H. Baumann, S. Weber, S. Scherrer, A. Müller, Joachim Bill

Keywords:

Amorphous Ceramics, Diffusion, Ion Implantation, Secondary Ion Mass Spectroscopy (SIMS)

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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