Structural Defects and Electrical Properties of N/Ge Co-Implanted GaN

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Periodical:

Defect and Diffusion Forum (Volumes 206-207)

Edited by:

D.J. Fisher

Pages:

75-86

DOI:

10.4028/www.scientific.net/DDF.206-207.75

Citation:

Y. Nakano and T. Jimbo, "Structural Defects and Electrical Properties of N/Ge Co-Implanted GaN", Defect and Diffusion Forum, Vols. 206-207, pp. 75-86, 2002

Online since:

July 2002

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$35.00

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