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Deep Level Characterization and its Passivation in 3C-SiC Monitored by Capacitance Transient Methods
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The Formation of p-Type ZnO Films by Using a Diffusion Process
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The Role of Dislocations in the Plastic Behavior of Silicon Nitride A Review
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Structural Defects in Amorphous Silicon Oxynitride and Silicon Nitride
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Structural Defects in Amorphous Silicon Oxynitride and Silicon Nitride

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Defect and Diffusion Forum (Volumes 218-220)

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39-50

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https://doi.org/10.4028/www.scientific.net/DDF.218-220.39

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August 2003

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H. Kato, Y. Ohki

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Amorphous Materials, Band-Tail States, Paramagnetic Defects, Photoluminescence (PL), Poole-Frenkel Conduction, Static Disorder

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