Abstracts

Elastic Interaction of Micropipes in Crystals
a.761

Thermal Transport in Materials with Disclination Dipoles and Loops
a.762

Hyperdislocations in Misfit Dislocation Networks in Solid Films
a.763

True Potentials and Transition Barriers at Dislocations
a.764

Deformation-Twin Characterization Using Electron Back-Scattering
a.765

Local Migration of Grain Boundaries in Polycrystalline Materials
a.766

Changes in Grain Boundary Misorientation Caused by Dislocation Emission
a.767

Local Melting of Grain Boundaries Containing Impurity Atom Clusters
a.768

Stacking Faults and the Non-Equilibrium fcc → 18R1 Transformation
a.769

HomeDefect and Diffusion ForumDefects and Diffusion in Semiconductors VIDeformation-Twin Characterization Using Electron...

Deformation-Twin Characterization Using Electron Back-Scattering

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