First Principles Suggestions of Targeted Diffusion Experiments on SiO2

Article Preview

Abstract:

In this paper we propose a couple of experimental lines in order to probe specific features of oxygen and silicon diffusion in -quartz and SiO2 in general. We start from the results of atomistic first principles calculations and from their predictions concerning point defects formation free enthalpies; we suggest that measurements with variable oxygen partial pressure could confirm that, in well defined regimes, oxygen diffusion is controlled by doubly negative oxygen interstitials. Along similar lines, for silicon diffusion, one should check the real equilibrium conditions of samples, with gaseous oxygen or bulk silicon, or closed conditions. We discuss our predictions for silicon diffusion, that could clarify some discrepancies between experimental results. Another possible probe would be to perform measurements under hydrostatic pressure, in order to measure the formation volume of the migrating species and to compare it to the theoretical values.

You might also be interested in these eBooks

Info:

Periodical:

Defect and Diffusion Forum (Volumes 237-240)

Pages:

127-132

Citation:

Online since:

April 2005

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2005 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Lamkin M. A. et al.: J. Europ. Cer. Soc. Vol. 10 (1992), pp.347-367.

Google Scholar

[2] M. Uematsu et al.: Appl. Phys. Lett. Vol. 84 (2004), pp.876-878.

Google Scholar

[3] Mikkelsen, J. C.: Appl. Phys. Lett. Vol. 45 (1984), p.1187.

Google Scholar

[4] Roma, G. and Limoge Y.: Phys. Rev. B Vol. 70 (2004), p.174101.

Google Scholar

[5] S. Fukatsu et al.: Jpn. J. Appl. Phys. Vol. 42 (2003).

Google Scholar

[6] H. Kageshima et al.: to be published in Proceedings of ICPS04.

Google Scholar

[7] M. Uematsu: this volume, contribution n. I-29.

Google Scholar

[8] S. Fukatsu et al.: Appl. Phys. Lett. Vol. 83 (2003), pp.3897-3899.

Google Scholar

[9] D. Tsoukalas, C. Tsamis, and P. Normand: J. Appl. Phys. Vol. 89 (2001), pp.7809-7813.

Google Scholar

[10] D. Mathiot et al.: J. Appl. Phys. Vol. 94 (2003), pp.2136-2138.

Google Scholar

[11] T. Takahasi et al.: J. Appl. Phys. Vol. 93 (2003), pp.3674-3678.

Google Scholar

[12] O. Jaoul, F. B´ejina, F. ´Elie, and F. Abel: Phys. Rev. Lett. Vol. 74 (1995), p.2038 This article was processed using the LATEX macro package with TTP style.

Google Scholar