Probing the Effects of SHI and Doping-Induced Defects in Nanocrystalline Spinel Ferrites

Abstract:

• Periodical: Defect and Diffusion Forum (Volumes 242-244)
• Pages: 255-276
• DOI: https://doi.org/10.4028/www.scientific.net/DDF.242-244.255
• Online since: September 2005
• Authors: Sanjukta Ghosh, Ajay Gupta, V.Raghavendra Reddy, V. Ganesan, Mukul Gupta, Saif Ahmed Khan, S. Kundu, Nitender Kumar
• Keywords: Defect, Ferrite, Magnetic Property, Nanocrystal, Positron Annihilation, SHI

References

[1994] 6733 8. C. Dufour, E. Paumier, M. Toulemonde, Radiation Effects and Defects 26 (1993) 119 9. J. Provost, C. Simon, M. Hervieu, D. Groult, V. Hardy, F. Studer, M. Toulemonde, MRS Bulletin

DOI: 10.1557/s0883769400045863

[1995] 22 10. F. Studer, C. Houpert, D. Groult, J. Yunfan, A. Meftah, M. Toulemonde, Nuclear Instruments and Methods in Physics Research B 82 (1993) 91 11. N. Kumar, Thesis, Jamia Millia Islamia University, 1999 12. F. Scordari in "Fundamentals of Crystallography", edited by C. Giacovazzo, Oxford Univ. Press, New York 13. S. Ghosh, P. M. G. Nambissan, . Bhattacharya, Physics Letters A 325 (2004) 301 14. S. Ghosh, P. M. G. Nambissan, . Bhattacharya, Physica B 353 (2004) 75 15. S. Ghosh, P. Ayyub, N. Kumar, S. A. Khan and D. Banerjee, Nuclear Instruments and Methods in Physics Research B 212 (2003) 510 16. S. Ghosh, A. Gupta, P. Ayyub, N. Kumar, S.A. Khan, D. Banerjee and R. Bhattacharya, Nuclear Instruments and Methods in Physics Research B 225 (2004) 310 17. S. R. Shinde, A. Bhagwat, S. I. Patil, S. B. Ogale, G. K. Mehta, S. K. Date, G. Marest, Journal of Magnetism and Magnetic Materials 186 (1998) 342 12 18. M. Rose, A. G. Balogh, H. Hahn, Nuclear Instruments and Methods in Physics Research B 127/128 (1997) 119 19. S. Hemon, F. Gourbilleau, C. Dufour, E. Paumier, E. Dooryhee, A. Rouanet, Nuclear Instruments and Methods in Physics Research B 122 (1997) 526 20. J. M. costantini, J. M. Desvignes, A. Perez, F. Studer, Journal of Applied Physics 87 (2000) 1899 21. Gang Chen, Journal of Nanoparticle Research 2 (2000) 199 22. A. Berthelot, S. Hemon, F. Gourbilleau, C. Dufour, E. Dooryhee, E. Paumier, Nuclear Instruments and Methods in Physics Research B 146 (1998) 437 23. H. Pascard, Physical Review B 33 (1986) 7252 24. H. Pascard, Physical Review B 30 (1984) 2299 25. H. Hu, "Nature & Behaviour of Grain boundaries", pp.155-26

[1998] 1341 32. J. P. Singh, R. Singh, N. C. Misra, V. Ganesan, D. Kanjilal, Nuclear Instruments and Methods in Physics Research B 179 (2001) 37 33. L. cliché, S. Roorda, M. Chicoine, . A. Masut, Physical Review Letters 75 (1995) 2348 34. M. Chicoine, S. Roorda, L. Cliché, R. A. Masut, Physical Review B 56 (1997) 1551 35. J. B. Malherbe, R. Q. Qdendaal, Applied Surface Science 144-145 (1999) 192 36. M. K. Scerl, P. Sigmund, N. Q. Lam, Nuclear Instruments and Methods in Physics Research B 120 (1996) 221 37. C. A. Volkert Journal of Applied Physics 70 (1991) 3521 13 38. P. Sigmund Physical Review B 184 (1969) 383 39. P. Williams, B. U. . Sundqvist, Physical Review Letters 58 (1987) 1031 40. S. Banerjee, R. E. Johnson, Physical Review B 43 (1991) 12707 41. D. Fenyo, R. E. Johnson, Physical Review B 46 (1992) 5090 42. A. Dupasquier & W. Brandt (Eds), "Positron Solid State Physics, Proceedings of International School of Physics 'Enrico Fermi'", 1995, IOS Press, The Netherlands; P. Hautojarvi (Ed.), "Positrons in Solids", Springer, Berlin 1979 43. P. P. Kirichok, A. J. Antoshchuk, Inorganic Materials 13 (1977) 1073 44. R. M. Nieminen, M. J. Manninen in "Positrons in Solids", Edited by P. Hautojarvi, Springer-Verlag, Berlin 1979 45. P. P. Chattopadhyay, P. M. G. Nambissan, S. K. Pabi, I. Manna, Physical Review B 63

[2001] 054107 14 -10 0 10 20 30 40 50 60 70 80 90 100 110 103 104 105 106 107 108 film annealed at 900 0 C film annealed at 800 0 C film annealed at 700 0 C Resistivity [Ohm-cm] Fluence [10 1 1 ions/cm 2 ] Fig.1 resistivity versus fluence when Li-Mg ferrite thin films irradiated with 190 MeV Au ions 15 Fig. 2 Resistivity versus fluence when Li-ferrite thin films irradiated with 150 MeV Ni ions 16 -1500 -1000 -500 0 500 1000 1500 -2.0x10-6 -1.5x10-6 -1.0x10-6 -5.0x10-7 0.0 5.0x10-7 1.0x10-6 1.5x10-6 2.0x10-6 Kerr Intensity (arb. units) H (Oersted) Unirradiated 2.5 * 10 12 ions/cm 2 5 * 10 12 ions/cm 2 Fig. 3 Kerr intensity versus applied field in 6LF film after 150 MeV Ni ion irradiation at different fluences measured by MOKE technique. 17 9.1x10 -5 9.2x10 -5 9.2x10 -5 9.3x10 -5 9.3x10 -5 9.4x10 -5 9.4x10 -5 9.5x10 -5 -6.0x10 -6 -5.0x10 -6 -4.0x10 -6 -3.0x10 -6 -2.0x10 -6 -1.0x10 -6 0.0 1.0x10 -6 -1500 -1000 -500 0 500 1000 1500 -2.5x10 -6 -2.0x10 -6 -1.5x10 -6 -1.0x10 -6 -5.0x10 -7 0.0 5.0x10 -7 -1500 -1000 -500 0 500 1000 1500 -4.0x10 -6 -3.0x10 -6 -2.0x10 -6 -1.0x10 -6 0.0 Ker Intensity (arb. units) Unirradiated 7LF film 2.5 * 1012 ions/cm2 5 * 1012 ions/cm 2 H (Oersted) 1.2 * 10 13 ions/cm2 H (Oersted) Fig. 4 Kerr intensity versus applied field in 7LF film after 150 MeV Ni ion irradiation at different fluences measured by MOKE technique. 18 Fig. 5 M versus H curve for 6LF film irradiated at different fluences of 150 MeV Ni ions 19 Fig. 6 M versus H curve for 8LF film irradiaresistivity versus fluence when Li-Mg ferrite thin films irradiated with 190 MeV Au ionsted at different fluences of 150 MeV Ni ions 20 Fig. 7a Fig. 7b Fig. 7 AFM images of irradiated 8LMF films at (a) 2.5 E 12 ions/cm2 (b) 1 E 13 ions/cm2 21 Fig. 8a 150 MeV Ni Fig. 8b Fig. 8. AFM images of (a)pristine 6LF film (b) 150 MeV Ni ion irradiated at 2.5 E 12 ions/cm2 22 Table I. Positron lifetime parameters of Li-Mg ferrites (in powdered form) with increase in milling hour Sample ττττ1 (ps) I1 (%) ττττ2 (ps) I2 (%) LM0 (milled for 0 hr) 54 58.3 226 40 LM04 ( milled for 4 hr) 58.3 60 262 38.14 LM010 ( milled for 10 hr ) 57 63.6 268 34.4 LM015 ( milled for 15 hr ) 56 67.7 271 30.6 LM025 ( milled for 25 hr ) 60.5 54.5 282 43 LM030 ( milled for 30 hr ) 63.6 56.7 289.4 41.2