Determination of Copper Self-Diffusion Coefficients on the Base of High-Temperature Creep Data

Danil V. Vaganov; Sergei Zhevnenko

doi:10.4028/www.scientific.net/DDF.249.115

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Determination of Copper Self-Diffusion Coefficients on the Base of High-Temperature Creep Data

Abstract:

Indirect method is used for determination of copper self-diffusion coefficient on the base of high-temperature creep data. These data are obtained by the use of the new measuring device and assuming that Nabarro-Herring mechanism acts.

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Periodical:

Defect and Diffusion Forum (Volume 249)

Pages:

115-118

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.249.115

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Online since:

January 2006

Authors:

Danil V. Vaganov, Sergei Zhevnenko

Keywords:

Copper (Cu), High-Temperature Creep, Nabarro-Herring Theory, Self-Diffusion

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References

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