Determination of Copper Self-Diffusion Coefficients on the Base of High-Temperature Creep Data

Abstract:

Article Preview

Indirect method is used for determination of copper self-diffusion coefficient on the base of high-temperature creep data. These data are obtained by the use of the new measuring device and assuming that Nabarro-Herring mechanism acts.

Info:

Periodical:

Edited by:

B.S. Bokstein and B.B. Straumal

Pages:

115-118

DOI:

10.4028/www.scientific.net/DDF.249.115

Citation:

D. V. Vaganov and S. N. Zhevnenko, "Determination of Copper Self-Diffusion Coefficients on the Base of High-Temperature Creep Data", Defect and Diffusion Forum, Vol. 249, pp. 115-118, 2006

Online since:

January 2006

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.