Diffusion Parameters Determination by a Non-Destructive Technique with an Assumption of Mass Exchange on the Surface

O.B. Bodnar; I.M. Aristova; A.A. Mazilkin; A.N. Chaika; P.Yu Popov

doi:10.4028/www.scientific.net/DDF.249.189

Paper Titles

Experimental Evidence of Iron Segregation in Copper Grain Boundaries as Deduced from Type B Diffusion Measurements
p.161

Retardation Effect of Grain Boundary Segregation on Grain Boundary Diffusion
p.167

Some Remarks on the Magnitude of the Chemical Diffusivities at Moving Grain Boundaries
p.173

Shape of Moving Grain Boundary and its Influence on Grain Boundary Motion in Zinc
p.183

Diffusion Parameters Determination by a Non-Destructive Technique with an Assumption of Mass Exchange on the Surface
p.189

Diffusion in the Interface Region of Ti/TiAl-Nb Bonding
p.193

On the Kinetic Mechanism of Ga Penetration in Al Bicrystals under Small Residual Stress
p.201

On the Grain Boundary Grooving in Thin Filaments
p.213

Surface Spreading and Penetration of Liquid and Solid Ga in Thin Polycrystalline Ag Films
p.219

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Diffusion Parameters Determination by a Non-Destructive Technique with an Assumption of Mass Exchange on the Surface

Abstract:

Theoretical base for non-destructive diffusion parameters determination technique in solids taking into account the dopant flux from the sample surface is presented. Diffusion of the nitrogen implanted in the tungsten single crystals was determined in temperature range 700–820°C. Surface concentration of nitrogen was obtained by Auger electron spectroscopy. Initial distribution of the nitrogen in subsurface region was measured by secondary-ion mass-spectroscopy. Two dopant atom fluxes found in subsurface region of the ion-implanted material are supposed to connect with the radiation damages and with the bulk diffusion mechanism.