• Registration Log In
  • For Libraries
  • For Publication
  • Open Access
  • Downloads
  • About Us
  • Contact Us
For Libraries For Publication Open Access Downloads About Us Contact Us
Abstracts
Si/SiGe: Dislocations and Stacking Faults
a.383
Si/SiO2: Diffusion and Point Defects
a.384
Si/SiO2: Surface Diffusion
a.385
Si/SiO2: Interface Defects
a.386
Si/SiO2: Interface Defects
a.387
Si/SiO2: Point Defects
a.388
SiC: Al, N Diffusion
a.389
SiC: C Surface Diffusion
a.390
SiC, SiCN, SiN: H Diffusion
a.391
HomeDefect and Diffusion ForumDefects and Diffusion in Semiconductors - An...Si/SiO<sub>2</sub>: Interface Defects

Si/SiO2: Interface Defects

Page: A387

  • For Libraries
  • For Publication
  • Insights
  • Downloads
  • About Us
  • Policy & Ethics
  • Contact Us
  • Imprint
  • Privacy Policy
  • Sitemap
  • All Conferences
  • All Special Issues
  • All News
  • Open Access Partners

© 2025 Trans Tech Publications Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies. For open access content, terms of the Creative Commons licensing CC-BY are applied.
Scientific.Net is a registered trademark of Trans Tech Publications Ltd.