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Abstracts
Diffusion Processes: Diffusion-Controlled Growth of Semiconductor Nanowires
a.369
Diffusion Processes: Ab initio Simulation of Self-Diffusion in Semiconductors
a.370
Diffusion Processes: Measurement of Atomic Diffusion in the Sub-Nanometer Range
a.371
Diffusion Processes: Non-Equilibrium Drift-Diffusion in Inhomogeneous Electric Fields
a.372
Point Defects: Defect Characterization in High-Resistivity Semiconductors
a.373
Point Defects: Defect Profiles in Semiconductor Structures
a.374
Point Defects: Defects of Structure of Superlattices Based upon II–VI Alloys
a.375
Point Defects: Effects of External Stress on Defect Complexes in Semiconductors
a.376
Point Defects: Vacancy Engineering for Ultra-Shallow Junction Formation
a.377
HomeDefect and Diffusion ForumDefects and Diffusion in Semiconductors XPoint Defects: Defect Characterization in...

Point Defects: Defect Characterization in High-Resistivity Semiconductors

Page: A373

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