Diffusion Processes: Measurement of Atomic Diffusion in the Sub-Nanometer Range
a.371
a.371
Diffusion Processes: Non-Equilibrium Drift-Diffusion in Inhomogeneous Electric Fields
a.372
a.372
Point Defects: Defect Characterization in High-Resistivity Semiconductors
a.373
a.373
Point Defects: Defect Profiles in Semiconductor Structures
a.374
a.374
Point Defects: Defects of Structure of Superlattices Based upon II–VI Alloys
a.375
a.375
Point Defects: Effects of External Stress on Defect Complexes in Semiconductors
a.376
a.376
Point Defects: Vacancy Engineering for Ultra-Shallow Junction Formation
a.377
a.377
Point Defects: Piezospectroscopic Analysis of Mobile Defects in Semiconductors
a.378
a.378
Linear Defects: Strain Distribution in Arrays in Mismatched III–V Semiconductors
a.379
a.379
Point Defects: Defects of Structure of Superlattices Based upon II–VI Alloys
Page: A375