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Abstracts
Point Defects: Defect Characterization in High-Resistivity Semiconductors
a.373
Point Defects: Defect Profiles in Semiconductor Structures
a.374
Point Defects: Defects of Structure of Superlattices Based upon II–VI Alloys
a.375
Point Defects: Effects of External Stress on Defect Complexes in Semiconductors
a.376
Point Defects: Vacancy Engineering for Ultra-Shallow Junction Formation
a.377
Point Defects: Piezospectroscopic Analysis of Mobile Defects in Semiconductors
a.378
Linear Defects: Strain Distribution in Arrays in Mismatched III–V Semiconductors
a.379
Linear Defects: Threshold Stresses for Dislocation Motion in Extrinsic Semiconductors
a.380
Linear Defects: Bound Electronic States on a Dislocation Kink
a.381
HomeDefect and Diffusion ForumDefects and Diffusion in Semiconductors XPoint Defects: Vacancy Engineering for...

Point Defects: Vacancy Engineering for Ultra-Shallow Junction Formation

Page: A377

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