Analysis of Component Depth Profiles at the Interface of Ti6242 Alloy and SiC, SiN Coatings after High Temperature Oxidation in Air

Abstract:

Article Preview

We have analyzed the interfacial elemental depth profile evolution after high temperature isothermal oxidation of SixCy and SixNy protective coatings deposited by dynamic ion mixing on a Ti6242 alloy (Ti-6Al-2Sn-4Zr-2Mo). Isothermal oxidation tests have been carried out at 600°C during 100 hours in air. We have observed a non-monotonic depth distribution of zirconium in GDOES and SIMS depth profiles after oxidation of SiC/Ti6242 and SiN/Ti6242 and we propose a kinetic model based on rate equations for analyzing the results. It is shown by modeling that a non-monotonic depth profile of zirconium occurs because zirconium from the Ti6242 alloy forms a zirconium oxide compound. As a result, the atomic concentration of zirconium decreases at the interface which induces a diffusion flux of zirconium from the bulk to the interface. This process leads to the increase of the total amount of zirconium at the film interface and thus formation of a non-monotonic depth profile.

Info:

Periodical:

Defect and Diffusion Forum (Volumes 297-301)

Edited by:

Andreas Öchsner, Graeme E. Murch, Ali Shokuhfar and João M.P.Q. Delgado

Pages:

433-438

DOI:

10.4028/www.scientific.net/DDF.297-301.433

Citation:

A. Galdikas et al., "Analysis of Component Depth Profiles at the Interface of Ti6242 Alloy and SiC, SiN Coatings after High Temperature Oxidation in Air", Defect and Diffusion Forum, Vols. 297-301, pp. 433-438, 2010

Online since:

April 2010

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.