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Phase Coexistence at MPB in PZT Thin Films prepared by Sol-Gel Processing
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SrBi₂Nb₂O₉ Ferroelectric Thin Films prepared by Sol-Gel Spin-Coating
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Production of Dense Lead Zirconate Titanate (PZT) Films
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LiNbO₃ Thin Films prepared from a Polymeric Precursor Method
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SAW Materials and Devices Characterization of High Resolution and Accuracy
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Fabrication Processes of Magnetic and Dielectric Multilayer Ceramics
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Grain Boundary Structures in Electronic Ceramics
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Valence States of MgO, AI₂O₃ and Metal-Oxide Interfaces
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Ceramic Micropackages Realised through the Technology. Specific to Electronic Components
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HomeKey Engineering MaterialsKey Engineering Materials Vols. 132-136SAW Materials and Devices Characterization of High...

SAW Materials and Devices Characterization of High Resolution and Accuracy

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Euro Ceramics V

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Periodical:

Key Engineering Materials (Volumes 132-136)

Pages:

1147-1150

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.132-136.1147

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Online since:

April 1997

Authors:

M. Weihnacht, K. Franke, Karsten Kunze, Harald Schmidt

Keywords:

Optical Probing, Scanning Force Microscopy, Surface Acoustic Wave (SAW), Thermoelastic Wave Excitation

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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