Study on the Communication between Single Parameter Profilometer and PC

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Periodical:

Key Engineering Materials (Volumes 259-260)

Edited by:

Xipeng Xu

Pages:

687-691

DOI:

10.4028/www.scientific.net/KEM.259-260.687

Citation:

Y. M. Quan et al., "Study on the Communication between Single Parameter Profilometer and PC ", Key Engineering Materials, Vols. 259-260, pp. 687-691, 2004

Online since:

March 2004

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$38.00

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