Paper Titles

Effects of Fe-TiB2 Addition as Binder Phase on the Liquid Phase Sintering Behaviour of Tungsten Carbide Cermets
p.973

Electrical Conductivity of an Alumina Matrix and FeAl Particles Composites
p.977

Fracture Toughness of Alumina-Mullite Composites Produced by Infiltration Process
p.981

Grain Growth in Corundum Oxides-Doped Uranium Dioxide and Effects of Grain Growth to the Mechanical Properties of Uranium Dioxide such as Elasticity Determined by Ultrasonic Methods
p.985

Investigation of the Sintering Behavior of Ultrapure α-Alumina Containing Low Amounts of SiO₂
p.989

High Thermal Shock Resistant Aluminium Titanate Type Ceramics
p.993

Influence of Alumina Precursors on Microstructure and Creep Behavior of Sol-Gel Derived Mullite Ceramics
p.997

Influence of Preparation Routes on the Surface Degradation of ATZ Ceramics
p.1001

Influence of Process Parameters on the Phase Composition of SiAlON Ceramics from Polish Fly Ash
p.1005

HomeKey Engineering MaterialsKey Engineering Materials Vols. 264-268Investigation of the Sintering Behavior of...

Investigation of the Sintering Behavior of Ultrapure α-Alumina Containing Low Amounts of SiO₂

Article Preview

Abstract:

You might also be interested in these eBooks

Euro Ceramics VIII

Info:

Periodical:

Key Engineering Materials (Volumes 264-268)

Pages:

989-992

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.264-268.989

Citation:

Cite this paper

Online since:

May 2004

Authors:

Nicolas Louet, Thierry Epicier, Yves Jorand, Gilbert Fantozzi

Keywords:

Aluminum (Al), Dilatometry, Glassy Films, Microstructure, Sintering, SiO₂

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2004 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] C. W. PARK, D. Y. YOON, J. Am. Ceram. Soc., Vol. 83.

[10] pp.2605-2609 (2000).

[2] K. L. GAVRILOV, S. J. BENNISON, K. R. MIKESKA, J. M. CHABALA, R. LEVI-SETTI, J. Am. Ceram. Soc., Vol. 82.

[4] pp.1001-1008 (1999).

[3] C. H. LEE, F. A. KRÖGER, J. Am. Ceram. Soc., Vol. 68.

[2] pp.92-99 (1985).

[4] S. BAIK, C. L. WHITE, J. Am. Ceram. Soc., Vol. 70.

[9] pp.682-688 ( 1987).

[5] R. F. COOK, A. G. SCHROTT, J. Am. Ceram. Soc., Vol. 71.

[1] pp.50-58 (1988).

[6] P. E.D. MORGAN , M. s. KOUTSOUTIS, J. Am. Ceram. Soc., Vol. 68.

[6] C-156-158 (1985).

[7] H. ERKALFA, Z. MISIRLI, M. DEMIRCI, C. TOY, T. BAYKARA, J. Eur. Ceram. Soc., Vol. 15, pp.165-171 (1995).

[9] M. K. LOUDJANI, C. HAUT, J. Eur. Ceram. Soc., Vol. 16, pp.1099-1106 (1996).

[10] S. I. BAE, S. BAIK, J. Mater. Sci., Vol. 28, pp.4197-4204 (1993).

[11] S. I. BAE, S. BAIK, J. Am. Ceram. Soc., Vol. 77.

[10] pp.2499-2504 (1994).

[12] J. H. YOO, J. C. NAM, S. BAIK, J. Am. Ceram. Soc., Vol. 82.

[8] pp.2233-2238 (1999).

[13] D. R. CLARKE, J. Am. Ceram. Soc., Vol. 70.

[1] pp.15-22 (1987).

[14] I. -J. BAE, S. BAIK, J. Am. Ceram. Soc., Vol. 80.

[5] pp.1149-1156 (1997). Figure 6. SEM micrographs of 2000ppm SiO2 doped sample sintering 2h at 1550°C below P ( a) and 2h at 1600°C above P (b) under static air. 5 µm 5 µm a) b).