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HomeKey Engineering MaterialsKey Engineering Materials Vols. 270-273Line Defect Detection in TFT-LCD Using Directional...

Line Defect Detection in TFT-LCD Using Directional Filter Bank and Adaptive Multilevel Thresholding

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Periodical:

Key Engineering Materials (Volumes 270-273)

Pages:

233-238

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.270-273.233

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Online since:

August 2004

Authors:

Jong Hwan Oh, Dong Min Kwak, Kyu Bong Lee, Young Chul Song, Doo Hyun Choi, Kil Houm Park

Keywords:

Directional Filter Bank, Inspection, LCM, Line-Defect, Line-Mura

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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